{"id":952,"date":"2025-07-16T15:14:14","date_gmt":"2025-07-16T15:14:14","guid":{"rendered":"https:\/\/els-journal.net\/wp\/about\/"},"modified":"2025-07-16T15:15:38","modified_gmt":"2025-07-16T15:15:38","slug":"29201-virtual-simulation-of-integrated-circuits-combining-ap-with-de-algorithm","status":"publish","type":"page","link":"https:\/\/els-journal.net\/wp\/?page_id=952","title":{"rendered":"29201 Virtual Simulation of Integrated Circuits Combining AP with DE Algorithm"},"content":{"rendered":"\n\n\n<h3>Vol. 29, No. 2 &#8211; December 2025<\/h3>\n<h3>Virtual Simulation of Integrated Circuits Combining AP with DE Algorithm<\/h3>\n<h5>https:\/\/doi.org\/10.53314\/ELS2529043H<\/h5>\n<h5>Peipei Hu<\/h5>\n<h5><b>Abstract<\/b><\/h5>\n<h5>As computers develops, virtual simulation technology&nbsp;<span style=\"font-size: 14px;\">becomes an important means of integrated circuit design.&nbsp;<\/span><span style=\"font-size: 14px;\">Therefore, based on the demand for virtual simulation of integrated&nbsp;<\/span><span style=\"font-size: 14px;\">circuits, a simulation method combining affinity propagation&nbsp;<\/span><span style=\"font-size: 14px;\">and differential evolution algorithm was proposed. By applying&nbsp;<\/span><span style=\"font-size: 14px;\">the affinity propagation to circuit fault diagnosis and combining&nbsp;<\/span><span style=\"font-size: 14px;\">it with differential evolution algorithm, circuit parameters optimization&nbsp;<\/span><span style=\"font-size: 14px;\">was carried out. These experiments confirm that the fusion&nbsp;<\/span><span style=\"font-size: 14px;\">of affinity propagation and differential evolution algorithm has a&nbsp;<\/span><span style=\"font-size: 14px;\">precision of 94.26%, recall of 93.41%, mean F1 of 88.59%, convergence&nbsp;<\/span><span style=\"font-size: 14px;\">speed of 56.77 seconds, and stability of 93.17%. The affinity&nbsp;<\/span><span style=\"font-size: 14px;\">propagation performs well in clustering. Especially without&nbsp;<\/span><span style=\"font-size: 14px;\">pre-defining the classes, it can identify the position and number of&nbsp;<\/span><span style=\"font-size: 14px;\">class centers automatically. The simulation of integrating affinity&nbsp;<\/span><span style=\"font-size: 14px;\">propagation and differential evolution algorithm has broad application&nbsp;<\/span><span style=\"font-size: 14px;\">prospects in virtual simulation of integrated circuits. It can&nbsp;<\/span><span style=\"font-size: 14px;\">improve simulation effectiveness and performance, providing effective&nbsp;<\/span><span style=\"font-size: 14px;\">support for circuit design and testing.<\/span><\/h5>\n<h5>Full text:  <a class=\"fas fa-file-pdf\" href=\"https:\/\/els-journal.net\/wp\/wp-content\/uploads\/2025\/07\/2025-29-2-01.pdf\" target=\"_blank\" rel=\"noopener\"><\/a><\/h5>\n\n\n\n\n<a target=\"_blank\" href=\"http:\/\/www.scopus.com\/inward\/citedby.uri?partnerID=HzOxMe3b&#038;doi=10.53314\/ELS2529043H&#038;origin=inward\" ref=\"scopus-citedby\" rel=\"noopener\"><image src=\"http:\/\/api.elsevier.com\/content\/abstract\/citation-count?doi=10.53314\/ELS2529043H&#038;httpAccept=image%2Fjpeg&#038;apiKey=87124910cd33413b75b0a6f4e70d58bd\" border=\"0\" alt=\"cited by count\"\/><\/a>\n\n\n\n\nGoogle Scholar Citations <a target=\"_blank\" class=\"fas fa-external-link-alt\" href=\"http:\/\/scholar.google.com\/scholar?hl=en&#038;lr=&#038;cites=http:\/\/dx.doi.org\/10.53314\/ELS2529043H\" rel=\"noopener\"><\/a>\n\n\n\n\n<center> <span class=\"__dimensions_badge_embed__\" data-doi=\"10.53314\/ELS2529043H\" data-style=\"small_circle\"><\/span> <\/center> <script async src=\"https:\/\/badge.dimensions.ai\/badge.js\" charset=\"utf-8\"><\/script>\n\n\n\n\n<center>Google Scholar Citations <a target=\"_blank\" class=\"fas fa-external-link-alt\" href=\"http:\/\/scholar.google.com\/scholar?hl=en&#038;lr=&#038;cites=http:\/\/dx.doi.org\/10.53314\/ELS2529043H\" rel=\"noopener\"><\/a><\/center>\n\n\n\n\n<a target=\"_blank\" href=\"http:\/\/www.scopus.com\/inward\/citedby.uri?partnerID=HzOxMe3b&#038;doi=10.53314\/ELS2529043H&#038;origin=inward\" ref=\"scopus-citedby\" rel=\"noopener\"><image src=\"http:\/\/api.elsevier.com\/content\/abstract\/citation-count?doi=10.53314\/ELS2529043H&#038;httpAccept=image%2Fjpeg&#038;apiKey=87124910cd33413b75b0a6f4e70d58bd\" border=\"0\" alt=\"cited by count\"\/><\/a>\n\n\n\n\n<center><span class=\"__dimensions_badge_embed__\" data-doi=\"10.53314\/ELS2529043H\" data-style=\"large_rectangle\"><\/span><\/center><script async src=\"https:\/\/badge.dimensions.ai\/badge.js\" charset=\"utf-8\"><\/script>\n\n\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":873,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-952","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=\/wp\/v2\/pages\/952","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=952"}],"version-history":[{"count":5,"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=\/wp\/v2\/pages\/952\/revisions"}],"predecessor-version":[{"id":961,"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=\/wp\/v2\/pages\/952\/revisions\/961"}],"up":[{"embeddable":true,"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=\/wp\/v2\/pages\/873"}],"wp:attachment":[{"href":"https:\/\/els-journal.net\/wp\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=952"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}